NASA NTRS · 19650000241
Novel probe simplifies electronic component testing
Abstract
Test probe, in conjunction with standard equipment, tests axial-lead electronic components in their original packages. The probe can be modified to test any electronic component with automatic or nonautomatic equipment.
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Syner, W. F.. 1965-08-01. Novel probe simplifies electronic component testing. https://ntrs.nasa.gov/citations/19650000241
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