NASA NTRS · 19650012159
Microelectronics research on silicon-silicon oxide structures and interfaces third quarterly report, 1 dec. 1964 - 28 feb. 1965
Abstract
Electron microscopy calculations in minimum and maximum capacitance theories for silicon-silicon oxide structures and interfaces
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
1965-02-28. Microelectronics research on silicon-silicon oxide structures and interfaces third quarterly report, 1 dec. 1964 - 28 feb. 1965. https://ntrs.nasa.gov/citations/19650012159
Cite the original work for its findings. Save a collection to share your selection of sources.