NASA NTRS · 19650039749
Chemical analysis of surfaces using alpha particles.
Abstract
Chemical analysis of surfaces using alpha-particle interactions from curium 242 sources and semiconductor silicon detectors
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Franzgrote, E., Patterson, J. H., Turkevich, A. L.. 1965-03-15. Chemical analysis of surfaces using alpha particles.. https://ntrs.nasa.gov/citations/19650039749
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