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NASA NTRS · 19660023475

Study of failure and reliability in microelectronics devices Second quarterly report

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Abstract

Failure analyses on microelectronic devices subjected to temperature-stress cycling, and life testing

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MICROMINIATURIZED ELECTRONIC EQUIPMENT FAILURE MODE THERMAL CYCLING FATIGUE

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1966-02-01. Study of failure and reliability in microelectronics devices Second quarterly report. https://ntrs.nasa.gov/citations/19660023475

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