NASA NTRS · 19660023878
Chemical Analysis of Surfaces Using Alpha Particles
Abstract
Chemical analysis of surfaces using alpha particle interactions in instruments incorporating curium 242 alpha sources and semiconductor silicon detectors
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Franzgrote, E., Patterson, J. H., Turkevich, A. L.. 1964-07-01. Chemical Analysis of Surfaces Using Alpha Particles. https://ntrs.nasa.gov/citations/19660023878
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