NASA NTRS · 19660049605
Critical excitation function of distributed- parameter devices.
Abstract
Critical excitation function used to estimate transient response of thin film devices at time intervals exceeding greatest time constant
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Happ, W. W., Staudhammer, J.. 1966-03-01. Critical excitation function of distributed- parameter devices.. https://ntrs.nasa.gov/citations/19660049605
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