NASA NTRS · 19670022237
Study of metallurgical problems related to microelectronic reliability
Abstract
Metallurgical methods for detection and analysis of failure mechanisms in microelectronic devices
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Beatty, R. P., Cline, J. E.. 1967-06-01. Study of metallurgical problems related to microelectronic reliability. https://ntrs.nasa.gov/citations/19670022237
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