NASA NTRS · 19680000179
Application of a truncated normal failure distribution in reliability testing
Abstract
Statistical truncated normal distribution function is applied as a time-to-failure distribution function in equipment reliability estimations. Age-dependent characteristics of the truncated function provide a basis for formulating a system of high-reliability testing that effectively merges statistical, engineering, and cost considerations.
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Groves, C., Jr.. 1968-06-01. Application of a truncated normal failure distribution in reliability testing. https://ntrs.nasa.gov/citations/19680000179
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