NASA NTRS · 19680000463
Electronic component reliability analysis by data reduction system
Abstract
Mechanized data reduction system has been designed to take advantage of the data handling capacity of computers and to reduce voluminous and unrelated test and performance data to a format useful for the rapid analysis of electronic component reliability.
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Dimm, R. M., Hunt, D. G.. 1968-11-01. Electronic component reliability analysis by data reduction system. https://ntrs.nasa.gov/citations/19680000463
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