NASA NTRS · 19680000518
Reliable method for testing gross leaks in semiconductor component packages
Abstract
Simple, reliable, inexpensive method for gross-leak testing has been devised, based upon the conventional fine-leak technique. The sensitivity ranges from the detection of very large leaks down to leaks of 10 to the minus seven cc helium per sec.
Keep this discovery
Explore connections, maps & timelines
Altshuler, T. L.. 1968-12-01. Reliable method for testing gross leaks in semiconductor component packages. https://ntrs.nasa.gov/citations/19680000518
Cite the original work for its findings. Save a collection to share your selection of sources.