NASA NTRS · 19680034512
Contamination of MOS field effect transistors.
Abstract
Positive ion current emission by tungsten and molybdenum studied for influence of impurities on MOSFET transistors
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Hoenig, S. A.. 1967-12-01. Contamination of MOS field effect transistors.. https://ntrs.nasa.gov/citations/19680034512
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