NASA NTRS · 19680049250
IR analysis of second breakdown modes in power transistors.
Abstract
Power transistor reliability against second breakdown, locating breakdown by IR fast scan microscope and measuring breakdown voltage
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Dostoomian, A. S., Nowakowski, M. F.. 1968-03-01. IR analysis of second breakdown modes in power transistors.. https://ntrs.nasa.gov/citations/19680049250
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