NASA NTRS · 19680056012
A method for determining and testing for second breakdown characteristics in transistors.
Abstract
Test equipment for second breakdown characteristics of power transistors
Keep this discovery
Explore connections, maps & timelines
Morris, J. K.. 1967-01-01. A method for determining and testing for second breakdown characteristics in transistors.. https://ntrs.nasa.gov/citations/19680056012
Cite the original work for its findings. Save a collection to share your selection of sources.