NASA NTRS · 19690000335
Preferred-orientation analysis of polycrystalline materials
Abstract
Automatic device built around a goniometer examines characteristics of polycrystalline materials and determines preferred orientations of crystallites. It is automatically rotatable in each of two planes and has circuit regulated sequential rotation. A fixed X ray source in conjunction with a detector examines the material.
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De Wys, E. C.. 1969-09-01. Preferred-orientation analysis of polycrystalline materials. https://ntrs.nasa.gov/citations/19690000335
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