NASA NTRS · 19690000557
Flexible high-voltage supply for experimental electron microscope
Abstract
Scanning microscope uses a field-emission tip for the electron source, an electron gun that simultaneously accelerates and focuses electrons from the source, and one auxiliary lens to produce a final probe size at the specimen on the order of angstroms.
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Chapman, G. L., Jung, E. A., Lewis, R. N., Van Loon, L. S., Welter, L. M.. 1969-10-01. Flexible high-voltage supply for experimental electron microscope. https://ntrs.nasa.gov/citations/19690000557
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