NASA NTRS · 19690041786
Some parameters affecting Auger and photoelectron spectroscopy as an analytical technique.
Abstract
Auger and photoelectron spectroscopy for chemical analysis, noting effects of sample thickness, sample potential, surface contamination and X ray incident angle
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Adler, I., Lamothe, R., Yin, L. I.. 1969-02-01. Some parameters affecting Auger and photoelectron spectroscopy as an analytical technique.. https://ntrs.nasa.gov/citations/19690041786
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