NASA NTRS · 19690042995
Reliability assessment of microcircuits and microelectronic systems.
Abstract
Microcircuit components and microelectronic systems reliability assessment including short term testing, noting digital systems, packaging, production controls, etc
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Hall, E. C.. 1968-01-01. Reliability assessment of microcircuits and microelectronic systems.. https://ntrs.nasa.gov/citations/19690042995
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