NASA NTRS · 19690064535
Algorithms for test patterns in multiterminal devices with symmetry constraints.
Abstract
N-terminal parent networks with symmetry constraints derived for nonredundant one port configurations through combinatorial functions test patterns, using computer algorithm
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Happ, W. W., Weitzenfeld, A. S.. 1969-01-01. Algorithms for test patterns in multiterminal devices with symmetry constraints.. https://ntrs.nasa.gov/citations/19690064535
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