NASA NTRS · 19700050089
An algorithm and a program for generation of test patterns for sequential circuits
Abstract
Test pattern generation algorithm and program for failure detection in asynchronous sequential logic circuits, using combinational method
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Putzolu, G. R., Roth, J. P.. 1970-01-01. An algorithm and a program for generation of test patterns for sequential circuits. https://ntrs.nasa.gov/citations/19700050089
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