NASA NTRS ยท 19710000431
Shielding method for polycrystalline and epitaxy growths
Abstract
Technique prevents silicon wafers from adhering to susceptor following silicon epitaxial deposition. Annular ring of refractory material goes around wafer during epitaxial deposit. Silicon is deposited on ring, susceptor, and portions of wafer. Ring breaks away from susceptor and wafer and no silicon undergrowth occurs.
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Bue, J. L.. 1971-11-01. Shielding method for polycrystalline and epitaxy growths. https://ntrs.nasa.gov/citations/19710000431
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