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NASA NTRS ยท 19710000431

Shielding method for polycrystalline and epitaxy growths

Abstract

Technique prevents silicon wafers from adhering to susceptor following silicon epitaxial deposition. Annular ring of refractory material goes around wafer during epitaxial deposit. Silicon is deposited on ring, susceptor, and portions of wafer. Ring breaks away from susceptor and wafer and no silicon undergrowth occurs.

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BibTeXRIS

Bue, J. L.. 1971-11-01. Shielding method for polycrystalline and epitaxy growths. https://ntrs.nasa.gov/citations/19710000431

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