NASA NTRS · 19710000468
Contact-resistance test probes: A concept
Abstract
Devices are used in inspection of contact resistance in plated connectors after assembly into cables. System permits rapid inspection of connectors when mating connectors or special apparatus are not available, and enables source of excessive resistance to be precisely determined.
Keep this discovery
Explore connections, maps & timelines
Brooks, C. H., Maxwell, J. H., Mc Dermott, R. J.. 1971-12-01. Contact-resistance test probes: A concept. https://ntrs.nasa.gov/citations/19710000468
Cite the original work for its findings. Save a collection to share your selection of sources.