NASA NTRS · 19710053854
New strain analysis technique based on thin- film optical measurements
Abstract
Strain analysis based on thin metallic film optical measurements, determining principal strain directions from wrinkle and microfracture patterns
Keep this discovery
Explore connections, maps & timelines
Williams, J. G.. 1971-05-01. New strain analysis technique based on thin- film optical measurements. https://ntrs.nasa.gov/citations/19710053854
Cite the original work for its findings. Save a collection to share your selection of sources.