Sequential control chart methodology

Abstract

A modification of the V mask sequential control chart is proposed. In this modified scheme, a parabolic section is included in the mask to provide better performance when the process undergoes a large change in the mean from goal conditions. It is shown that the modified V mask can be implemented either in conventional graphic form, or in an algorithmic form suitable for a digital computer. Average run lengths are given for a typical range of circumstances. It also is shown that the conventional Shewhart chart is better than a sequential chart for the specific purpose of promptly detecting very large shifts of the mean from goal conditions.