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NASA NTRS · 19720050434

Temperature profile determination in an absorbing plasma.

Abstract

A new method has been developed to determine the temperature profile of an optically-non-thin plasma. The technique is essentially an extension of the brightness-emissivity method to the case of a cylindrically-symmetric plasma.

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BibTeXRIS

Usher, J. L., Campbell, H. D.. 1972-07-01. Temperature profile determination in an absorbing plasma.. https://ntrs.nasa.gov/citations/19720050434

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