Resolution of defects by microwave holography.

Abstract

Basic techniques for microwave holography are considered, giving attention to ways of approaching the problem, swept frequency depth resolution, optical processing of swept frequency data, B-scans with optical processing, and the side-looking radar principle. Aspects of image formation with Vander Lugt filters are discussed together with holograms for Vander Lugt filter imaging. It is shown that a single basic scanning operation with microwaves can produce records for optical processing to provide any of the common readouts used in flaw detection.