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NASA NTRS · 19720060564

Experimental characterization of yield induced by surface flaws.

Abstract

Recent experimental findings related to the surface deformation and plastic zones associated with a deep surface flaw in Mode I tension loading are surveyed. Results of front and back surface dimpling, as determined by replica profiling and interferometry, are presented. The stresses required to initiate back surface dimpling are inversely related both to the crack depth and to the crack length. The plastic zone at the crack tip is described using results obtained from Fe-3Si specimens which have been studied with the electrolytic etching technique. It is shown that the plastic zone may be identified with a state of plane strain around the entire crack perimeter, except for the very thin layer near the crack tips on the front surface, where the deformation state approximates plane stress.

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Francis, P. H., Davidson, D. L.. 1972-01-01. Experimental characterization of yield induced by surface flaws.. https://ntrs.nasa.gov/citations/19720060564

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