NASA NTRS · 19730000196
An improved method for obtaining a normalized junction temperature for semiconductors: A concept
Abstract
Failure rate for given semiconductor device is simply determined by reading value of normalized junction temperature from printout for any given combination of ambient temperature, stress ratio, and maximum rated junction temperature, and obtaining corresponding failure rate from graph.
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Trivedi, S. N.. 1973-06-01. An improved method for obtaining a normalized junction temperature for semiconductors: A concept. https://ntrs.nasa.gov/citations/19730000196
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