NASA NTRS · 19730003165
Accelerated life testing of spacecraft subsystems
Abstract
The rationale and requirements for conducting accelerated life tests on electronic subsystems of spacecraft are presented. A method for applying data on the reliability and temperature sensitivity of the parts contained in a sybsystem to the selection of accelerated life test parameters is described. Additional considerations affecting the formulation of test requirements are identified, and practical limitations of accelerated aging are described.
Keep this discovery
Explore connections, maps & timelines
Wiksten, D., Swanson, J.. 1972-11-01. Accelerated life testing of spacecraft subsystems. https://ntrs.nasa.gov/citations/19730003165
Cite the original work for its findings. Save a collection to share your selection of sources.