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NASA NTRS · 19730018684

Elastohydrodynamic film thickness model for heavily loaded contacts

Abstract

An empirical elastohydrodynamic (EHD) film thickness formula for predicting the minimum film thickness occurring within heavily loaded contacts (maximum Hertz stresses above 150,000 psi) was developed. The formula was based upon X-ray film thickness measurements made with synthetic paraffinic, fluorocarbon, Type II ester and polyphenyl ether fluids covering a wide range of test conditions. Comparisons were made between predictions from an isothermal EHD theory and the test data. The deduced relationship was found to adequately reflect the high-load dependence exhibited by the measured data. The effects of contact geometry, material and lubricant properties on the form of the empirical model are also discussed.

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BibTeXRIS

Loewenthal, S. H., Parker, R. J., Zaretsky, E. V.. 1973-01-01. Elastohydrodynamic film thickness model for heavily loaded contacts. https://ntrs.nasa.gov/citations/19730018684

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