Lunar topography - Global determination by radar.

Abstract

Previous methods used for two-dimensional radar mapping of the moon are contrasted with new techniques that add altitude information to the radar map. Delay-Doppler stereoscopy and delay-Doppler interferometry are shown to provide surface-height variations with higher accuracy and better global fidelity than has been possible previously. Sample results are presented for altitude contours on the moon as obtained with the Haystack and Westford radar systems of the Massachusetts Institute of Technology. An appendix describes the mathematical principles of delay-Doppler interferometry in determining the position of an arbitrary reflecting region of the lunar surface from measurements of the time delay, Doppler shift, and fringe phase of radar echoes from that region.