Cost optimization of spacecraft test levels

Abstract

Common to all nondestructive type testing of hardware that provides the necessary confidence in the design is the question regarding the proper magnitude of the test level. The objective of this investigation was to study the possibility of establishing cost optimized test levels of a rather general nature. This investigation was based on studying the influence of test level on a cost of error cost model that reflects the adverse effects of 'undertesting' and 'overtesting'. For the assumed conditions of normal distribution for the random variables and a protoflight spacecraft case, the results indicated that the limits for an optimum test factor can range between slightly less than 1.0 to slightly more than 1.5.