NASA NTRS · 19750010251
Analytical study of spacecraft deposition contamination by internal reflection spectroscopy
Abstract
The in-situ vacuum chamber designed around the IRE was tested under vacuum. The contamination analyzer system was tested using two liquid contaminant materials. The analysis of the contaminants on the SL-4 rendezvous window shows that the material has methyl silicone, hydroxyl, and carbonyl radicals. The analysis of the outgassing material from Shuttle TPS shows silicone as the primary product.
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Mookherji, T. K.. 1975-01-01. Analytical study of spacecraft deposition contamination by internal reflection spectroscopy. https://ntrs.nasa.gov/citations/19750010251
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