NASA NTRS ยท 19750015777
Investigation of problems associated with solid encapsulation of high voltage electronic assemblies; also Reynolds connector study
Abstract
Electric breakdown prevention in vacuum and encapsulation of high voltage electronic circuits was studied. The lap shear method was used to measure adhesive strengths. The permeation constants of air at ambient room temperature through four different space-grade encapsulants was measured. Order of magnitude was calculated for the time that air bubble pressures drop to the corona region. High voltage connectors with L-type cable attached were tested in a vacuum system at various pressures. The cable system was shown to suppress catastrophic breakdown when filled with and surrounded by gas in the corona region of pressures, but did not prove to be completely noise free.
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Bever, R. S.. 1975-04-15. Investigation of problems associated with solid encapsulation of high voltage electronic assemblies; also Reynolds connector study. https://ntrs.nasa.gov/citations/19750015777
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