Radiative property investigation

Abstract

Measurements of the bidirectional reflections of NASA paints Z-93 and S-13G were made for 0.5, 1.78, and 2.5 microns, source incidence angles of 0, 30, 60, and 75 deg, and four detector azimuth positions. The bidirectional reflectance distribution was found to be near Lambert for azimuth positions not to close to 180 deg from the source incident azimuth. The reflectance distribution at an azimuth of 180 deg from the source is close to Lambert for near normal source incidents angles, and becomes much larger than Lambert as the source incident angle approach grazing. The reflectance deviates from Lambert as the wavelength increases. Comparison of data for the paints shows Z-93 reflectance is much closer to Lambert than S-13G. When there is a peak in the reflectance distribution it occurred at the specular angle or an angle larger than the specular angle.