NASA NTRS · 19750018404
Yield prediction by analysis of multispectral scanner data
Abstract
A preliminary model describing the growth and grain yield of wheat was developed. The modeled growth characteristics of the wheat crop were used to compute wheat canopy reflectance using a model of vegetation canopy reflectance. The modeled reflectance characteristics were compared with the corresponding growth characteristics and grain yield in order to infer their relationships. It appears that periodic wheat canopy reflectance characteristics potentially derivable from earth satellites will be useful in forecasting wheat grain yield.
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Colwell, J. E., Suits, G. H.. 1975-05-01. Yield prediction by analysis of multispectral scanner data. https://ntrs.nasa.gov/citations/19750018404
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