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NASA NTRS · 19750055623

Auger electron spectroscopy of lunar samples

Abstract

Auger spectroscopy has been employed to study the surface composition of a number of grains from the submillimeter lunar fines. Some of the problems associated with using this technique for lunar sample analyses are discussed in terms of relevant physical principles. The use of inert gas sputtering to obtain thickness profiles of surface films is shown to be important in this type of investigation. Four anorthite grains from the Apollo 17 fines have been examined for evidence of vapor-deposited surface coatings of micrometeorite impact origin. The results indicate that the thickness of surface deposits, if they exist at all, are orders of magnitude less than expected. Auger analysis of orange glass balls form the 74220,107 fines have established sulfur-rich surface coatings on the order of 30 A in thickness.

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BibTeXRIS

Grant, R. W., Housley, R. M., Szalkowski, F. J., Marcus, H. L.. 1974-01-01. Auger electron spectroscopy of lunar samples. https://ntrs.nasa.gov/citations/19750055623

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