NASA NTRS · 19760000552
Detecting contamination on a metal surface
Abstract
Thin layers of contaminant on metal surface are detected by measuring surface-potential difference between reference electrode and surface of interest. Procedure does not require mechanical contact with surface under examination.
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Harris, J. M., Marcus, H. L., Smith, T.. 1977-03-01. Detecting contamination on a metal surface. https://ntrs.nasa.gov/citations/19760000552
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