Optical measurements on contaminated surfaces

Abstract

A bidirectional reflectometer system was developed for in situ measurements of the changes in spectral reflectance of surfaces contaminated with films of organic materials. The system permits experiments with films of controlled thickness in an environment that simulates the thermal, radiation, and vacuum conditions of space. The mechanical and optical construction of the reflectometer are discussed in detail, and actual data curves are used to illustrate its operation and performance.