Subresolution imaging - Use of wavelength and angular diversity techniques

Abstract

The paper demonstrates the possibility of using an illumination system tunable in angle or wavelength to determine the amplitude and height structure of an object within the resolution cell defined by the resolving power of some imaging system. It is noted that since the value of the electric field at a point on the image of an object varies with the wavelength or angle of illumination on the object, the Fourier transform of this variation provides directly the amplitude and phase structure of the object within the resolution cell corresponding to the image point of interest. This Fourier transform is calculated, and it is shown that the transform of the electric-field intensity with respect to the inverse wavelength dimension is simply the autocorrelation of the electric-field variation with wavelength. Practical techniques that can be employed to measure the subresolution detail of an object are briefly discussed.