Monitoring wheat growth with radar

Abstract

The scattering properties of wheat in the 8-18 GHz band were studied as a function of frequency, polarization, incidence angle, and crop maturity. Supporting ground truth was collected at the time of measurement. The data indicate the radar backscattering coefficient is sensitive to both radar system parameters and crop characteristics, particularly at incidence angles near nadir. Linear regression analysis of the backscattering coefficient (dB) on both time and plant moisture content result in rather good correlation, as high as 0.9, with the slope of these regression lines being 0.55 dB/day and -0.275 dB% plant moisture at 9.4 GHz at nadir. It is found that the coefficient undergoes rapid variations shortly before and after the wheat is harvested. Both of these analyses suggest methods for estimating wheat maturity and for monitoring the progress of harvest.