NASA NTRS ยท 19770000260
Safe handling practices for electrostatic-sensitive devices
Abstract
Review is detailed compilation of safe handling practices for Metal-Oxide Semiconductor (MOS) circuit elements and other devices that are susceptible to damage by electrostatic discharge. Article lists safety procedures for all aspects of handling and use of these components. Included are guidelines for setting up static-free work station and list of materials and equipment needed to maintain antistatic protection. Appendix gives vendors of these items.
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Herring, L. L.. 1977-11-01. Safe handling practices for electrostatic-sensitive devices. https://ntrs.nasa.gov/citations/19770000260
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