NASA NTRS · 19770010333
X-ray quantum efficiencies of CCD's
Abstract
The X-ray quantum efficiency of a CCD was still high enough to obtain good X-ray imaging with this device. The range and response of the CCD to incident X-rays in the 5 to 14.1 KeV range were determined experimentally. Knowledge of this range and response allows direct measurement of quantum efficiency. Quantum efficiency decreased monotonically from 82% to 35% in the range studied. Comparison of experimental and theoretical quantum efficiencies allowed a determination of silicon bulk electron diffusion length. For the device studied, the electron diffusion length was 75 micrometers.
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Peckerar, M., Baker, W. D., Nagel, D. J.. 1976-01-01. X-ray quantum efficiencies of CCD's. https://ntrs.nasa.gov/citations/19770010333
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