NASA NTRS · 19770067842
Critical currents in sputtered copper molybdenum sulphide
Abstract
Critical currents in a sputtered Chevrel-phase copper molybdenum sulfide have been measured at 4.2 K as a function of applied magnetic field. Self-field critical-current values up to 10 to the 9th A/sq m were found, decreasing to 10 to the 8th A/sq m at 3 T. Graphs of pinning forces versus field were found to be independent of field direction, and the pinning mechanism is sample independent. Critical-current densities for sputtered lead molybdenum sulphide are estimated to be about 10 to the 8th A/sq m at 26 T based on a scaling law for pinning.
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Alterovitz, S. A., Woollam, J. A., Kammerdiner, L., Luo, H.-L.. 1977-08-01. Critical currents in sputtered copper molybdenum sulphide. https://ntrs.nasa.gov/citations/19770067842
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