NASA NTRS · 19780000007
Curve tracer checks CMOS IC's
Abstract
Conventional transistor curve tracer can speed up failure analysis of CMOS integrated circuits by displaying transfer characteristics while device is subjected to vibration or environmental testing. Failures that show up as change in threshold voltage or transfer characteristics are quickly detected.
Keep this discovery
Explore connections, maps & timelines
Kizer, F.. 1978-06-01. Curve tracer checks CMOS IC's. https://ntrs.nasa.gov/citations/19780000007
Cite the original work for its findings. Save a collection to share your selection of sources.