NASA NTRS · 19780000389
Shock during PIND test frees particles
Abstract
Recent study on Particle-Impact Noise-Detection (PIND) shows impact at 1,500 to 4,000 G normally imparted to hybrid microcircuits during testing knocks loose stray trapped particle that can be subsequentially removed. Process may be 80 to 90 percent effective in removal of particles depending on type of test utilized.
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Caruso, S. V., Keister, F. Z.. 1979-01-01. Shock during PIND test frees particles. https://ntrs.nasa.gov/citations/19780000389
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