NASA NTRS · 19780000540
Multiple-sample holder for IC testing
Abstract
Carrousel tray speeds up testing process by feeding mass spectrometer up to 12 sealed integrated circuit packages in rapid succession for analysis of contaminants and total gas composition.
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Haack, R. F.. 1979-03-01. Multiple-sample holder for IC testing. https://ntrs.nasa.gov/citations/19780000540
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