NASA NTRS ยท 19790000471
JANTX1N5554 switching diode
Abstract
Micro Semiconductor and Semtech diodes were tested. In group 1 tests Micro Semiconductor and Semtech lot testing was stopped because of excess failure rate. Failure analysis was performed on group 1 and 3 because of apparent failure mode.
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1980-06-01. JANTX1N5554 switching diode. https://ntrs.nasa.gov/citations/19790000471
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