NASA NTRS · 19790009079
Diode step stress program, JANTX1N5614
Abstract
The reliability of switching diode JANTX1N5614 was tested. The effect of power/temperature step stress on the diode was determined. Control sample units were maintained for verification of the electrical parametric testing. Results are reported.
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1978-12-01. Diode step stress program, JANTX1N5614. https://ntrs.nasa.gov/citations/19790009079
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