NASA NTRS · 19790010027
Diode step stress testing program for JANTX1N937b
Abstract
The effect was investigated of power/temperature step stress when applied to the zener diode JANTX1N937B manufactured by Motorola and Siemens. Test results, and failure analyses are included.
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1979-02-01. Diode step stress testing program for JANTX1N937b. https://ntrs.nasa.gov/citations/19790010027
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