NASA NTRS · 19790010028
Diode step stress testing program for JANTX1N972B
Abstract
The effect was studied of power/temperature step stress when applied to the zener diode JANTX1N972B manufactured by Siemens and Motorola. The power/temperature stress tests are presented, and failure analyses are included.
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1979-02-01. Diode step stress testing program for JANTX1N972B. https://ntrs.nasa.gov/citations/19790010028
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